Kai Chen

School of Materials Science and Engineering, Xi'an Jiaotong University
28 West Xianning Road, Xi'an, Shaanxi 710049, P. R. China
E-mail: kc_xjtu@mail.xjtu.edu.cn
Phone: +86-29-82668584, +86-18291911676
EDUCATION
- 2005 - 2009 UNIVERSITY OF CALIFORNIA LOS ANGELES, Los Angeles, CA, USA
Ph.D in Electronic Materials, Department of Materials Science and Engineering - 2001 - 2005 PEKING UNIVERSITY, Beijing, P. R. China
B.S. in Physical Chemistry, School of Chemistry and Molecular Engineering
EXPERIENCE
- Aug. 2011 - present
Associate professor, School of Materials Science and Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi, China
Director assistant, The Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano)
Associate director, Hysitron Applied Research Center (China) - Sep. 2010 - Jul. 2011
Postdoc, National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Advised by Prof. A. M. Minor - Sep. 2009 - Jul. 2010
Postdoc, Department of Earth and Planetary Science, University of California Berkeley, Advised by Prof. H.-R. Wenk - Mar. 2007 - Aug. 2009
Visiting scholar, Advanced Light Source, Lawrence Berkeley National Laboratory, Hosted by Dr. Nobumichi Tamura
PUBLICATIONS
- Jae-Woong Nah, Kai Chen, K. N. Tu, Bor-Rung Su and Chih Chen, Mechanism of electromigration induced failure in flip-chip solder joints with a 10um-thick Cu under-bump metallization, Journal of Materials Research, 22(3) 763-769, 2007
- Fan-Yi Ouyang, Kai Chen, K. N. Tu and Yi-Shao Lai, Effect of current crowding on whisker growth at the anode in flip chip solder joints, Applied Physics Letters, 91, 231919, 2007
- Di Xu, Wei Lek Kwan, Kai Chen, Xi Zhang, Vidvuds Ozolins and K. N. Tu, Nanotwin formation in copper thin films by stress/strain relaxation in pulse electrodeposition, Applied Physics Letters, 91, 254105, 2007
- Kai Chen, N. Tamura, B. C. Valek and K. N. Tu, Plastic deformation in Al (Cu) interconnects stressed by electromigration and studied by synchrotron polychromatic X-ray microdiffraction, Journal of Applied Physics, 104, 013513, 2008
- Kai Chen, N. Tamura and K. N. Tu, In-situ early stage electromigration study in Al line using synchrotron polychromatic X-ray microdiffraction, Materials Research Society Symposium Proceedings, 1079E, N05-02, 2008
- Martin Kunz, Nobumichi Tamura, Kai Chen, Alastair A. MacDowell, Richard S. Celestre, Matthew M. Church, Sirine Fakra, Edward E. Domning, James M. Glossinger, Dave W. Plate, Brian V. Smith, Tony Warwick, Howard A. Padmore and Ersan Ustundag, A dedicated superbend x-ray microdiffraction beamline for material-, geo- and environmental sciences at the Advanced Light Source, Review of Scientific Instruments, 80, 035108, 2009
- Kai Chen, Nobumichi Tamura and K. N. Tu, In-situ study of electromigration-induced grain rotation in Pb-free solder joint by synchrotron microdiffraction, Materials Research Society Symposium Proceedings, 1116E, I05-06, 2009
- Martin Kunz, Kai Chen, Nobumichi Tamura and Hans-Rudolf Wenk, Evidence for residual elastic strain in deformed natural quartz, American Mineralogist, 94, 1059, 2009
- N. Tamura, M. Kunz, K. Chen, R. S. Celestre, A. A. MacDowell and T. Warwick, A superbend X-ray microdiffraction beamline at the Advanced Light Source, Materials Science and Engineering A, 524, 28, 2009
- Kai Chen, N. Tamura, M. Kunz, K. N. Tu and Yi-Shao Lai, In situ measurement of electromigration-induced transient stress in Pb-free Sn-Cu solder joints by synchrotron radiation based X-ray polychromatic microdiffraction, Journal of Applied Physics, 106, 023502, 2009
- Hans-Rudolf Wenk, Paulo J. M. Monteiro, Martin Kunz, Kai Chen, Nobumichi Tamura, Luca Lutterotti and John Delacroz, Preferred orientation of ettringite in concrete fractures, Journal of Applied Crystallography, 42, 429, 2009
- J. Cao, Y. Gu, W. Fan, L. Q. Chen, D. F. Ogletree, K. Chen, N. Tamura, M. Kunz, C. Barrett, J. Seidel and J. Wu, Extended Mapping and Exploration of the Vanadium Dioxide Stress-Temperature Phase Diagram, Nano Letters, 10, 2667, 2010
- J. Cao, W. Fan, K. Chen, N. Tamura, M. Kunz, V. Eyert and J. Wu, Constant threshold resistivity in the metal-insulator transition of VO2, Physical Review B, 82, 241101, 2010
- Kai Chen, N. Tamura, Wei Tang, M. Kunz, Yi-Chia Chou, K. N. Tu and Yi-Shao Lai, High precision thermal stress study on flip chips by synchrotron polychromatic X-ray microdiffraction, Journal of Applied Physics, 107, 063502, 2010
- Gyuhyon Lee, Ju-Young Kim, Arief Suriadi Budiman, Nobumichi Tamura, Martin Kunz, Kai Chen, Michael J. Burek, Julia R. Greer and Ting Y, Tsui Fabrication, Structure, and Mechanical Properties of Indium Nanopillars, Acta Materialia, 58, 1361, 2010
- Alexandra Friedrich, Björn Winkler, Lkhamsuren Bayarjargal, Wolfgang H. Morgenroth, Erick A. Juarez-Arellano, Victor Milman, Keith Refson, Martin Kunz and Kai Chen, Novel nitrides of rhenium, Physical Review Letters, 105, 085504, 2010
- Jun Liu, Martin Kunz, Kai Chen, Nobumichi Tamura and Thomas J. Richardson, Visualization of charge distribution in a Lithium battery electrode, The Journal of Physical Chemistry Letters, 1(14), 2120, 2010
- Kai Chen, Martin Kunz Nobumichi Tamura and Hans-Rudolf Wenk, Evidence for high stress in quartz from the impact site of Vredefort, South Africa European Journal of Mineralogy, 23(2), 169-178, 2011
- Bongjin Simon Mun, Kai Chen, Youngchul Leem, Catherine Dejoie, Nobumichi Tamura, Martin Kunz, Zhi Liu, Michael Grass, Changwoo Park and Honglyoul Ju, Unusual structural transitions in macro-sized VO2 single crystals, Physics Stats Solidi (RRL), 5(3), 107-109, 2011
- Kai Chen, Martin Kunz Nobumichi Tamura and Hans-Rudolf Wenk, Deformation twinning and residual stress in calcite studied using synchrotron polychromatic x-ray microdiffraction, Physics and Chemistry of Minerals, 38(6), 491-500, 2011
- Catherine Dejoie, Martin Kunz, Nobumichi Tamura, Colin Bousige, Kai Chen, Simon Teat, Christine Beavers and Christian Baerlocher, Determining the effective white beam flux curve of a synchrotron beamline using Laue patterns, Journal of Applied Crystallography, 44, 177-183, 2011
- E. Rybacki, C. Janssen , R. Wirth, K. Chen, H. R. Wenk, D. Stromeyer and G. Dresen, Low-temperature deformation in calcite veins of SAFOD core samples (San Andreas Fault) - microstructural analysis and implications for fault rheology, Tectonophysics, 509, 107-119, 2011
- Hua Guo*, Kai Chen*, J. Oh, S. A. Syed Asif, O. L. Warren, Z. Shan, Kevin Wang, J. Wu and A. M. Minor (* joint first author), Mechanics and Dynamics of the Strain-Induced M1-M2 Structural Phase Transition in Individual VO2 Nanowires, Nano Letters, 11, 3207-3213, 2011
- Hans-Rudolf Wenk, Kai Chen and Rebecca Smith, Morphology and microstructure of magnetite and ilmenite inclusions in plagioclase from Adirondack anorthositic gneiss, American Mineralogist, 96, 1316-1324, 2011
- A. S. Budiman, N. Li, Q. Wei, J. K. Baldwin, J. Xiong, H. Luo, D. Trugman, Q. X. Jia, N. Tamura, M. Kunz, K. Chen and A. Misra, Growth and structural characterization of epitaxial Cu/Nb multilayers, Thin Solid Films, 519(13), 4137-4143, 2011
- Tian Tian, Kai Chen, A. A. MacDowell, Dula Parkinson, Yi-Shao Lai, and K. N. Tu, Quantitative x-ray micro-tomography study of 3D void growth induced by electromigration in eutectic SnPb flip chip solder joints, Scripta Materialia, 65, 646-649, 2011
- Taiji Zhang, Yurong Ma, Kai Chen, Martin Kunz, Nobumichi Tamura, Jun Xu, and Limin Qi, Ultra-thin flexible armor in Nature: interlocked Helical aragonite Nanofibers in Cavolinia Uncinata Shell and Its Relationship with Mechanical Properties, Angewandte Chemie International Edition, 50, 1-6, 2011
- Bongjin Simon Mun, Kai Chen, Joonseok Yoon, Catherine Dejoie, Nobumichi Tamura, Martin Kunz, Zhi Liu, Michael E. Grass, Sung-Kwan Mo, Changwoo Park, Y. Yvette Lee and Honglyoul Ju, Nonpercolative metal-insulator transition in VO2 single crystals, Physical Review B, 84, 113109, 2011
CONFERENCE PRESENTATIONS
- Feb 2010 Oral presentation at 2010 TMS Annual Meeting
"High precision thermal stress study on flip chips by synchrotron polychromatic X-ray microdiffraction” - Oct 2009 Invited talk at 2009 ALS Workshop on X-ray diffraction / fluorescence microscopy
"Introduction to the Microdiffraction Beamline (BL 12.3.2) at ALS” - Oct 2009 Invited talk at 2009 ALS Workshop on Synchrotron Science at ALS
"X-Ray Micro Diffraction” - Apr 2009 Oral presentation at 2009 Materials Research Society (MRS) Spring Meeting
"Synchrotron X-ray microdiffraction study of electromigration induced transient stress in Sn-Cu Pb-free solder joints” - Apr 2009 Poster presentation at 2009 Materials Research Society (MRS) Spring Meeting
"A Dedicated Submicron X-ray Diffraction Beamline for Materials Science Study at the Advanced Light Source” - Feb 2009 Oral presentation at 2009 TMS Annual Meeting
"Synchrotron X-ray microdiffraction study of electromigration induced transient stress in Sn-Cu Pb-free solder joints” - Feb 2009 Oral presentation at 2009 TMS Annual Meeting
"EM-Induced Orientation Evolution in Pb-Free Solder Joint by Synchrotron Microdiffraction” - Dec 2008 Oral presentation at 2008 Materials Research Society (MRS) Fall Meeting
"Synchrotron x-ray microdiffraction study of electromigration induced transient stress in Sn-Cu Pb-free solder joints” - Aug 2008 Oral presentation at the 57th Annual Conference on Applications of X-ray Analysis
"Synchrotron X–ray microdiffraction study of electromigration induced plastic deformation in Al interconnects” - Aug 2008 Oral presentation at the 8th International Conference on Residual Stresses
"Synchrotron X-ray microdiffraction study of electromigration induced microstructure evolution in Sn-Cu Pb-free solder joints” - Aug 2008 Poster presentation at the 8th International Conference on Residual Stresses
"EM-induced stress distribution in Al (Cu) interconnects studied by synchrotron X-ray microdiffraction” - Jul 2008 Oral presentation at 2008 Semiconductor Research Corporation annual review meeting
"In situ EM study on flip chip solder joints” - Mar 2008 Oral presentation at 2008 Materials Research Society (MRS) Spring Meeting
"Synchrotron X–ray microdiffraction study of electromigration induced plastic deformation in Al (Cu) interconnects” - Mar 2008 Poster presentation at Office of Basic Energy Sciences of Department of Energy (DOE) review for Advanced Light Source, Lawrence Berkeley National Laboratory
"Tin whisker growth studied by polychromatic X-ray microdiffraction”